Description:
Relationships between Rothbart’s 13 temperament sub-dimensions and the Attention-Deficit/Hyperactivity Disorder (ADHD) factors for the 2-factor model [inattention (IA) and hyperactivity/impulsivity (HI) domains] and the bifactor model (general ADHD, and specific factors for IA and HI) were examined in 267 adults from the general population. Regression analyses revealed that (1) both the IA and HI factors in the 2-factor model and the general ADHD factor in the bifactor model were predicted positively by sad, discomfort and associative sensitivity, and negatively by activation control, (2) the HI domain factor in the 2-factor model was also predicted negatively by inhibitory control, (3) the specific IA factor in the bifactor model was predicted negatively by activation control and attention control, and (4) the HI specific factor in the bifactor model was predicted negatively by inhibitory control and positively by sociability. These theoretical and clinical implications of the findings are discussed. ADHD
Description:
The Sensitivity to Punishment and Sensitivity to Reward Questionnaire (SPSRQ) has been proposed as a measure of the behavioral approach system (BAS) and behavioral inhibition system (BIS). Previous research with the SPSRQ has highlighted potential problems with the factor structure of the measure and individual item properties. The aim of the current studies was to use factor analytic and item response theory (IRT) methods to examine the psychometric properties of the SPSRQ. A further aim was to develop a short version of the SPSRQ. In Study 1, 393 adult participants completed the SPSRQ. The results from this study highlighted problems with the factor structure and item properties that had been noted in previous research. On this basis, a short form of the measure was proposed. In Study 2, the short form of the SPSRQ was tested with an independent sample (N = 327). These analyses suggested the short form of the SPSRQ had an improved factor structure, good item properties, and acceptable reliability.