Characterization of starch films containing starch nanoparticles. Part 2: Viscoelasticity and creep properties
- Authors: Shi, Aimin , Wang, Li-jun , Li, Dong , Adhikari, Benu
- Date: 2013
- Type: Text , Journal article
- Relation: Carbohydrate Polymers Vol. 96, no. 2 (2013), p. 602-610
- Full Text: false
- Reviewed:
- Description: Starch films were successfully produced by incorporating spray dried and vacuum-freeze dried starch nanoparticles. The frequency sweep, creep-recovery behavior and time-temperature superposition (TTS) on these films were studied. All these films exhibited dominant elastic behavior (than viscous behavior) over the entire frequency range (0.1-100 rad/s). The incorporation of both types of starch nanoparticles increased the storage and loss modulus, tan δ, creep strain, creep compliance and creep rate at long time frame and reduced the recovery rate of films while the effect of different kinds of starch nanoparticles on these parameters was similar both in magnitude and trend. TTS method was successfully used to predict long time (over 20 days) creep behavior through the master curves. The addition of these nanoparticles could increase the activation energy parameter used in TTS master curves. Power law and Burger's models were capable of fitting storage and loss modulus (R2 > 0.79) and creep data (R2 > 0.96), respectively. © 2012 Elsevier Ltd. All rights reserved.
- Description: C1
The effect of partial gelatinization of corn starch on its retrogradation
- Authors: Fu, Zong-qiang , Wang, Li-Jun , Li, Dong , Zhou, Yuguang , Adhikari, Benu
- Date: 2013
- Type: Text , Journal article
- Relation: Carbohydrate Polymers Vol. 97, no. 2 (2013), p. 512-517
- Full Text: false
- Reviewed:
- Description: The objective of this work was to investigate the effect of partial gelatinization of starch on its retrogradation using differential scanning calorimetry (DSC) and X-ray diffraction (XRD) techniques. The Avrami equation was used to predict the evolution of starch retrogradation kinetics. The degree of retrogradation in starch samples partially gelatinized 64 ?C (S64), 68 ?C (S68) and 70 ?C (S70) and control (S25) increased with storage time. The retrogradation enthalpies of S68 and S70 were almost four times as high as that of S64. The S25 and S64 had dominant A-type crystalline pattern while S68 and S70 showed dominant B-type crystalline pattern. The growth of remainder crystals was faster in S25 and S64, while both the nucleation and growth rates of new crystals were faster in S68 and S70. The Avrami model was found to represent the retrogradation kinetics data of these partially gelatinized starch samples quite satisfactorily (R2 > 0.95). © 2013 Elsevier Ltd. All rights reserved.
- Description: C1