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Dynamic event coverage in hybrid wireless sensor networks
- Alam, Kh Mahmudul, Kamruzzaman, Joarder, Karmakar, Gour, Murhsed, Manzur
Half-space mass : a maximally robust and efficient data depth method
- Chen, Bo, Ting, Kaiming, Washio, Takashi, Haffari, Gholamreza
Impact characterization of multiple-points-defect on machine fault diagnosis
- Yaqub, Muhammad, Gondal, Iqbal, Kamruzzaman, Joarder
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