- Title
- Multiple-points fault signature's dynamics modeling for bearing defect frequencies
- Creator
- Yaqub, Muhammad; Gondal, Iqbal; Kamruzzaman, Joarder
- Date
- 2011
- Type
- Text; Conference paper
- Identifier
- http://researchonline.federation.edu.au/vital/access/HandleResolver/1959.17/156688
- Identifier
- vital:11478
- Identifier
- https://publications.waset.org/15172/multiple-points-fault-signatures-dynamics-modeling-for-bearing-defect-frequencies
- Identifier
- ISBN:2010-376X
- Abstract
- Occurrence of a multiple-points fault in machine operations could result in exhibiting complex fault signatures, which could result in lowering fault diagnosis accuracy. In this study, a multiple-points defect model (MPDM) is proposed which can simulate fault signature-s dynamics for n-points bearing faults. Furthermore, this study identifies that in case of multiple-points fault in the rotary machine, the location of the dominant component of defect frequency shifts depending upon the relative location of the fault points which could mislead the fault diagnostic model to inaccurate detections. Analytical and experimental results are presented to characterize and validate the variation in the dominant component of defect frequency. Based on envelop detection analysis, a modification is recommended in the existing fault diagnostic models to consider the multiples of defect frequency rather than only considering the frequency spectrum at the defect frequency in order to incorporate the impact of multiple points fault.
- Publisher
- World Academy of Science, Engineering and Technology (WASET)
- Relation
- 2011 International Conference on Control, Automation, Robotics and Vision (ICCARV); Venice, Italy; 23rd-25th November 2011; published in Proceedings of the World Academy of Science, Engineering and Technology, International Journal of Mechanical, Aerospace, Industrial, Mechatronic and Manufacturing Engineering Vol. 5, p. 2548-2553
- Rights
- Copyright © 2017 World Academy of Science, Engineering and Technology. Published under CC BY license http://creativecommons.org/licenses/by/4.0
- Rights
- Open Access
- Rights
- This metadata is freely available under a CCO license
- Subject
- MD Multidisciplinary; Envelope detection; Machine defect frequency; Multiple faults; Machine health monitoring
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